Handbook of Materials Characterization

Handbook of Materials Characterization
Author: Surender Kumar Sharma
Publisher: Springer
Total Pages: 612
Release: 2018-09-18
Genre: Technology & Engineering
ISBN: 3319929550

This book focuses on the widely used experimental techniques available for the structural, morphological, and spectroscopic characterization of materials. Recent developments in a wide range of experimental techniques and their application to the quantification of materials properties are an essential side of this book. Moreover, it provides concise but thorough coverage of the practical and theoretical aspects of the analytical techniques used to characterize a wide variety of functional nanomaterials. The book provides an overview of widely used characterization techniques for a broad audience: from beginners and graduate students, to advanced specialists in both academia and industry.

Handbook of Materials Characterization

Handbook of Materials Characterization
Author: Surender Kumar Sharma
Publisher:
Total Pages: 613
Release: 2018
Genre: Analytical biochemistry
ISBN: 9783319929569

This book focuses on the widely used experimental techniques available for the structural, morphological, and spectroscopic characterization of materials. Recent developments in a wide range of experimental techniques and their application to the quantification of materials properties are an essential side of this book. Moreover, it provides concise but thorough coverage of the practical and theoretical aspects of the analytical techniques used to characterize a wide variety of functional nanomaterials. The book provides an overview of widely used characterization techniques for a broad audience: from beginners and graduate students, to advanced specialists in both academia and industry.

Materials Characterization Techniques

Materials Characterization Techniques
Author: Sam Zhang
Publisher: CRC Press
Total Pages: 344
Release: 2008-12-22
Genre: Science
ISBN: 1420042955

Experts must be able to analyze and distinguish all materials, or combinations of materials, in use today-whether they be metals, ceramics, polymers, semiconductors, or composites. To understand a material's structure, how that structure determines its properties, and how that material will subsequently work in technological applications, researche

X-ray Characterization of Materials

X-ray Characterization of Materials
Author: Eric Lifshin
Publisher: John Wiley & Sons
Total Pages: 277
Release: 2008-07-11
Genre: Technology & Engineering
ISBN: 3527613757

Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials. The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.

Materials Characterization

Materials Characterization
Author: Yang Leng
Publisher: John Wiley & Sons
Total Pages: 384
Release: 2009-03-04
Genre: Technology & Engineering
ISBN: 0470822996

This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.

Magnetic Measurement Techniques for Materials Characterization

Magnetic Measurement Techniques for Materials Characterization
Author: Victorino Franco
Publisher: Springer Nature
Total Pages: 814
Release: 2021-09-28
Genre: Technology & Engineering
ISBN: 3030704432

This book discusses the most commonly used techniques for characterizing magnetic material properties and their applications. It provides a comprehensive and easily digestible collection and review of magnetic measurement techniques. It also examines the underlying operating principles and techniques of magnetic measurements, and presents current examples where such measurements and properties are relevant. Given the pervasive nature of magnetic materials in everyday life, this book is a vital resource for both professionals and students wishing to deepen their understanding of the subject.

Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization

Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization
Author: Richard Haight
Publisher: World Scientific
Total Pages: 346
Release: 2012
Genre: Science
ISBN: 9814322849

As we delve more deeply into the physics and chemistry of functional materials and processes, we are inexorably driven to the nanoscale. And nowhere is the development of instrumentation and associated techniques more important to scientific progress than in the area of nanoscience. The dramatic expansion of efforts to peer into nanoscale materials and processes has made it critical to capture and summarize the cutting-edge instrumentation and techniques that have become indispensable for scientific investigation in this arena. This Handbook is a key resource developed for scientists, engineers and advanced graduate students in which eminent scientists present the forefront of instrumentation and techniques for the study of structural, optical and electronic properties of semiconductor nanostructures.

Encyclopedia of Materials Characterization

Encyclopedia of Materials Characterization
Author: Charles A. Evans
Publisher: Gulf Professional Publishing
Total Pages: 784
Release: 1992
Genre: Science
ISBN: 9780750691680

"This is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the series."--Knovel.

Handbook of Silicon Based MEMS Materials and Technologies

Handbook of Silicon Based MEMS Materials and Technologies
Author: Markku Tilli
Publisher: Elsevier
Total Pages: 670
Release: 2009-12-08
Genre: Technology & Engineering
ISBN: 0815519885

A comprehensive guide to MEMS materials, technologies and manufacturing, examining the state of the art with a particular emphasis on current and future applications. Key topics covered include: - Silicon as MEMS material - Material properties and measurement techniques - Analytical methods used in materials characterization - Modeling in MEMS - Measuring MEMS - Micromachining technologies in MEMS - Encapsulation of MEMS components - Emerging process technologies, including ALD and porous silicon Written by 73 world class MEMS contributors from around the globe, this volume covers materials selection as well as the most important process steps in bulk micromachining, fulfilling the needs of device design engineers and process or development engineers working in manufacturing processes. It also provides a comprehensive reference for the industrial R&D and academic communities. - Veikko Lindroos is Professor of Physical Metallurgy and Materials Science at Helsinki University of Technology, Finland. - Markku Tilli is Senior Vice President of Research at Okmetic, Vantaa, Finland. - Ari Lehto is Professor of Silicon Technology at Helsinki University of Technology, Finland. - Teruaki Motooka is Professor at the Department of Materials Science and Engineering, Kyushu University, Japan. - Provides vital packaging technologies and process knowledge for silicon direct bonding, anodic bonding, glass frit bonding, and related techniques - Shows how to protect devices from the environment and decrease package size for dramatic reduction of packaging costs - Discusses properties, preparation, and growth of silicon crystals and wafers - Explains the many properties (mechanical, electrostatic, optical, etc), manufacturing, processing, measuring (incl. focused beam techniques), and multiscale modeling methods of MEMS structures