Industrial Electrical Troubleshooting Iml

Industrial Electrical Troubleshooting Iml
Author: Lynn Lundquist
Publisher: Delmar Thomson Learning
Total Pages: 384
Release: 2000-04
Genre:
ISBN: 9780766806047

"Industrial Electrical Troubleshooting demonstrates the efficient use of certain electrical meters to troubleshoot relay-logic circuits with a single setting. Today, a generation of electronic meters is available to test voltage and continuity without changing the setting of the meter or de-energizing the circuit. Careful attention has been given to safety procedures throughout the book. Traditional troubleshooting techniques have not kept pace with this equipment though. Instructors and students will find comprehensive and up-to-date information for safely and efficiently locating problems and then troubleshooting online. Multimeters, clamp-on meters, ammeters, megohmmeters, proximity voltage meters, hand-held oscilloscopes and other meters are thoroughly discussed as plant electrical troubleshooting tools.

Springer Handbook of Automation

Springer Handbook of Automation
Author: Shimon Y. Nof
Publisher: Springer Nature
Total Pages: 1533
Release: 2023-06-16
Genre: Technology & Engineering
ISBN: 3030967298

This handbook incorporates new developments in automation. It also presents a widespread and well-structured conglomeration of new emerging application areas, such as medical systems and health, transportation, security and maintenance, service, construction and retail as well as production or logistics. The handbook is not only an ideal resource for automation experts but also for people new to this expanding field.

IBM FlashSystem 5200 Product Guide

IBM FlashSystem 5200 Product Guide
Author: Aldo Araujo Fonseca
Publisher: IBM Redbooks
Total Pages: 68
Release: 2022-07-22
Genre: Computers
ISBN: 0738459666

This IBM® Redbooks® Product Guide publication describes the IBM FlashSystem® 5200 solution, which is a next-generation IBM FlashSystem control enclosure. It is an NVMe end-to-end platform that is targeted at the entry and midrange market and delivers the full capabilities of IBM FlashCore® technology. It also provides a rich set of software-defined storage (SDS) features that are delivered by IBM Spectrum® Virtualize, including the following features: Data reduction and deduplication Dynamic tiering Thin provisioning Snapshots Cloning Replication Data copy services Transparent Cloud Tiering IBM HyperSwap® including 3-site replication for high availability (HA) Scale-out and scale-up configurations further enhance capacity and throughput for better availability. The IBM FlashSystem 5200 is a high-performance storage solution that is based on a revolutionary 1U form factor. It consists of 12 NVMe Flash Devices in a 1U storage enclosure drawer with full redundant canister components and no single point of failure. It is designed for businesses of all sizes, including small, remote, branch offices and regional clients. It is a smarter, self-optimizing solution that requires less management, which enables organizations to overcome their storage challenges. Flash has come of age and price point reductions mean that lower parts of the storage market are seeing the value of moving over to flash and NVMe--based solutions. The IBM FlashSystem 5200 advances this transition by providing incredibly dense tiers of flash in a more affordable package. With the benefit of IBM FlashCore Module compression and new QLC flash-based technology becoming available, a compelling argument exists to move away from Nearline SAS storage and on to NVMe. With the release of IBM FlashSystem 5200 Software V8.4, extra functions and features are available, including support for new Distributed RAID1 (DRAID1) features, GUI enhancements, Redirect-on-write for Data Reduction Pool (DRP) snapshots, and 3-site replication capabilities. This book is aimed at pre-sales and post-sales technical support and marketing and storage administrators.

Space Shuttle Missions Summary (NASA/TM-2011-216142)

Space Shuttle Missions Summary (NASA/TM-2011-216142)
Author: Robert D. Legler
Publisher: www.Militarybookshop.CompanyUK
Total Pages: 300
Release: 2011-09-01
Genre: Science
ISBN: 9781782662235

Full color publication. This document has been produced and updated over a 21-year period. It is intended to be a handy reference document, basically one page per flight, and care has been exercised to make it as error-free as possible. This document is basically "as flown" data and has been compiled from many sources including flight logs, flight rules, flight anomaly logs, mod flight descent summary, post flight analysis of mps propellants, FDRD, FRD, SODB, and the MER shuttle flight data and inflight anomaly list. Orbit distance traveled is taken from the PAO mission statistics.

Three Approaches to Data Analysis

Three Approaches to Data Analysis
Author: Igor Chikalov
Publisher: Springer Science & Business Media
Total Pages: 209
Release: 2012-07-28
Genre: Technology & Engineering
ISBN: 3642286674

In this book, the following three approaches to data analysis are presented: - Test Theory, founded by Sergei V. Yablonskii (1924-1998); the first publications appeared in 1955 and 1958, - Rough Sets, founded by Zdzisław I. Pawlak (1926-2006); the first publications appeared in 1981 and 1982, - Logical Analysis of Data, founded by Peter L. Hammer (1936-2006); the first publications appeared in 1986 and 1988. These three approaches have much in common, but researchers active in one of these areas often have a limited knowledge about the results and methods developed in the other two. On the other hand, each of the approaches shows some originality and we believe that the exchange of knowledge can stimulate further development of each of them. This can lead to new theoretical results and real-life applications and, in particular, new results based on combination of these three data analysis approaches can be expected. - Logical Analysis of Data, founded by Peter L. Hammer (1936-2006); the first publications appeared in 1986 and 1988. These three approaches have much in common, but researchers active in one of these areas often have a limited knowledge about the results and methods developed in the other two. On the other hand, each of the approaches shows some originality and we believe that the exchange of knowledge can stimulate further development of each of them. This can lead to new theoretical results and real-life applications and, in particular, new results based on combination of these three data analysis approaches can be expected. These three approaches have much in common, but researchers active in one of these areas often have a limited knowledge about the results and methods developed in the other two. On the other hand, each of the approaches shows some originality and we believe that the exchange of knowledge can stimulate further development of each of them. This can lead to new theoretical results and real-life applications and, in particular, new results based on combination of these three data analysis approaches can be expected.