Semiconductors and Semimetals

Semiconductors and Semimetals
Author:
Publisher: Academic Press
Total Pages: 471
Release: 1984-12-20
Genre: Technology & Engineering
ISBN: 0080864074

Semiconductors and Semimetals

Extended Abstracts

Extended Abstracts
Author: Electrochemical Society
Publisher:
Total Pages: 766
Release: 1981
Genre: Electrochemistry
ISBN:

Influence of Temperature on Microelectronics and System Reliability

Influence of Temperature on Microelectronics and System Reliability
Author: Pradeep Lall
Publisher: CRC Press
Total Pages: 332
Release: 2020-07-09
Genre: Technology & Engineering
ISBN: 0429605595

This book raises the level of understanding of thermal design criteria. It provides the design team with sufficient knowledge to help them evaluate device architecture trade-offs and the effects of operating temperatures. The author provides readers a sound scientific basis for system operation at realistic steady state temperatures without reliability penalties. Higher temperature performance than is commonly recommended is shown to be cost effective in production for life cycle costs. The microelectronic package considered in the book is assumed to consist of a semiconductor device with first-level interconnects that may be wirebonds, flip-chip, or tape automated bonds; die attach; substrate; substrate attach; case; lid; lid seal; and lead seal. The temperature effects on electrical parameters of both bipolar and MOSFET devices are discussed, and models quantifying the temperature effects on package elements are identified. Temperature-related models have been used to derive derating criteria for determining the maximum and minimum allowable temperature stresses for a given microelectronic package architecture. The first chapter outlines problems with some of the current modeling strategies. The next two chapters present microelectronic device failure mechanisms in terms of their dependence on steady state temperature, temperature cycle, temperature gradient, and rate of change of temperature at the chip and package level. Physics-of-failure based models used to characterize these failure mechanisms are identified and the variabilities in temperature dependence of each of the failure mechanisms are characterized. Chapters 4 and 5 describe the effects of temperature on the performance characteristics of MOS and bipolar devices. Chapter 6 discusses using high-temperature stress screens, including burn-in, for high-reliability applications. The burn-in conditions used by some manufacturers are examined and a physics-of-failure approach is described. The

Experimental Innovations in Surface Science

Experimental Innovations in Surface Science
Author: John T. Yates Jr.
Publisher: Springer
Total Pages: 637
Release: 2015-08-17
Genre: Science
ISBN: 3319176684

This book is a new edition of a classic text on experimental methods and instruments in surface science. It offers practical insight useful to chemists, physicists, and materials scientists working in experimental surface science. This enlarged second edition contains almost 300 descriptions of experimental methods. The more than 50 active areas with individual scientific and measurement concepts and activities relevant to each area are presented in this book. The key areas covered are: Vacuum System Technology, Mechanical Fabrication Techniques, Measurement Methods, Thermal Control, Delivery of Adsorbates to Surfaces, UHV Windows, Surface Preparation Methods, High Area Solids, Safety. The book is written for researchers and graduate students.