Introduction to Quantum Metrology

Introduction to Quantum Metrology
Author: Waldemar Nawrocki
Publisher: Springer
Total Pages: 287
Release: 2015-03-24
Genre: Technology & Engineering
ISBN: 3319156691

This book presents the theory of quantum effects used in metrology and results of the author’s own research in the field of quantum electronics. The book provides also quantum measurement standards used in many branches of metrology for electrical quantities, mass, length, time and frequency. This book represents the first comprehensive survey of quantum metrology problems. As a scientific survey, it propagates a new approach to metrology with more emphasis on its connection with physics. This is of importance for the constantly developing technologies and nanotechnologies in particular. Providing a presentation of practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a wide audience of physicists and metrologists in the broad sense of both terms. In 2014 a new system of units, the so called Quantum SI, is introduced. This book helps to understand and approve the new system to both technology and academic community.

Quantum Metrology

Quantum Metrology
Author: Ernst O. Göbel
Publisher: John Wiley & Sons
Total Pages: 243
Release: 2015-09-21
Genre: Science
ISBN: 3527412654

The International System of Units (SI) is the world's most widely used system of measurement, used every day in commerce and science, and is the modern form of the metric system. It currently comprises the meter (m), the kilogram (kg), the second (s), the ampere (A), the kelvin (K), the candela (cd) and the mole (mol)). The system is changing though, units and unit definitions are modified through international agreements as the technology of measurement progresses, and as the precision of measurements improves. The SI is now being redefined based on constants of nature and their realization by quantum standards. Therefore, the underlying physics and technologies will receive increasing interest, and not only in the metrology community but in all fields of science. This book introduces and explains the applications of modern physics concepts to metrology, the science and the applications of measurements. A special focus is made on the use of quantum standards for the realization of the forthcoming new SI (the international system of units). The basic physical phenomena are introduced on a level which provides comprehensive information for the experienced reader but also provides a guide for a more intense study of these phenomena for students.

Quantum Metrology, Imaging, and Communication

Quantum Metrology, Imaging, and Communication
Author: David S. Simon
Publisher: Springer
Total Pages: 279
Release: 2016-11-02
Genre: Science
ISBN: 3319465511

This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.

Quantum Measurement and Control

Quantum Measurement and Control
Author: Howard M. Wiseman
Publisher: Cambridge University Press
Total Pages: 477
Release: 2010
Genre: Mathematics
ISBN: 0521804426

Modern quantum measurement for graduate students and researchers in quantum information, quantum metrology, quantum control and related fields.

Quantum Measurement

Quantum Measurement
Author: Vladimir B. Braginsky
Publisher: Cambridge University Press
Total Pages: 216
Release: 1995-05-25
Genre: Science
ISBN: 9780521484138

This book is an up-to-date introduction to the quantum theory of measurement. Although the main principles of the field were elaborated in the 1930s by Bohr, Schrödinger, Heisenberg, von Neuman, and Mandelstam, it was not until the 1980s that technology became sufficiently advanced to allow its application in real experiments. Quantum measurement is now central to many ultra-high technology developments, such as "squeezed light," single atom traps, and searches for gravitational radiation. It is also considered to have great promise for computer science and engineering, particularly for its applications in information processing and transfer. The book begins with a brief introduction to the relevant theory and goes on to discuss all aspects of the design of practical quantum measurement systems.

Introduction to Quantum Metrology

Introduction to Quantum Metrology
Author: Waldemar Nawrocki
Publisher: Springer
Total Pages: 334
Release: 2019-05-30
Genre: Technology & Engineering
ISBN: 3030196771

This book discusses the theory of quantum effects used in metrology, and presents the author’s research findings in the field of quantum electronics. It also describes the quantum measurement standards used in various branches of metrology, such as those relating to electrical quantities, mass, length, time and frequency. The first comprehensive survey of quantum metrology problems, it introduces a new approach to metrology, placing a greater emphasis on its connection with physics, which is of importance for developing new technologies, nanotechnology in particular. Presenting practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a broad range of physicists and metrologists. It also promotes a better understanding and approval of the new system in both industry and academia. This second edition includes two new chapters focusing on the revised SI system and satellite positioning systems. Practical realization (mise en pratique) the base units (metre, kilogram, second, ampere, kelvin, candela, and mole), new defined in the revised SI, is presented in details. Another new chapter describes satellite positioning systems and their possible applications. In satellite positioning systems, like GPS, GLONASS, BeiDou and Galileo, quantum devices – atomic clocks – serve wide population of users.

Quantum Measurement Theory and its Applications

Quantum Measurement Theory and its Applications
Author: Kurt Jacobs
Publisher: Cambridge University Press
Total Pages: 729
Release: 2014-08-14
Genre: Science
ISBN: 1139992198

Recent experimental advances in the control of quantum superconducting circuits, nano-mechanical resonators and photonic crystals has meant that quantum measurement theory is now an indispensable part of the modelling and design of experimental technologies. This book, aimed at graduate students and researchers in physics, gives a thorough introduction to the basic theory of quantum measurement and many of its important modern applications. Measurement and control is explicitly treated in superconducting circuits and optical and opto-mechanical systems, and methods for deriving the Hamiltonians of superconducting circuits are introduced in detail. Further applications covered include feedback control, metrology, open systems and thermal environments, Maxwell's demon, and the quantum-to-classical transition.

The New International System of Units (SI)

The New International System of Units (SI)
Author: Ernst O. Göbel
Publisher: John Wiley & Sons
Total Pages: 276
Release: 2019-09-16
Genre: Science
ISBN: 3527344594

The International System of Units, the SI, provides the foundation for all measurements in science, engineering, economics, and society. The SI has been fundamentally revised in 2019. The new SI is a universal and highly stable unit system based on invariable constants of nature. Its implementation rests on quantum metrology and quantum standards, which base measurements on the manipulation and counting of single quantum objects, such as electrons, photons, ions, and flux quanta. This book explains and illustrates the new SI, its impact on measurements, and the quantum metrology and quantum technology behind it. The book is based on the book ?Quantum Metrology: Foundation of Units and Measurements? by the same authors. From the contents: -Measurement -The SI (Système International d?Unités) -Realization of the SI Second: Thermal Beam Cs Clock, Laser Cooling, and the Cs Fountain Clock -Flux Quanta, Josephson Effect, and the SI Volt -Quantum Hall Effect, the SI Ohm, and the SI Farad -Single-Charge Transfer Devices and the SI Ampere -The SI Kilogram, the Mole, and the Planck constant -The SI Kelvin and the Boltzmann Constant -Beyond the present SI: Optical Clocks and Quantum Radiometry -Outlook

Quantum Metrology with Photoelectrons

Quantum Metrology with Photoelectrons
Author: Paul Hockett
Publisher: Morgan & Claypool Publishers
Total Pages: 126
Release: 2018-04-20
Genre: Science
ISBN: 1681746883

Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and Advances discusses the fundamental concepts along with recent and emerging applications. Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on "complete" photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.