Selected Papers on Electronic Speckle Pattern Interferometry

Selected Papers on Electronic Speckle Pattern Interferometry
Author: Peter Meinlschmidt
Publisher: SPIE-International Society for Optical Engineering
Total Pages: 556
Release: 1996
Genre: Technology & Engineering
ISBN:

This collection of papers offers the principles and practices of electronic speckle pattern interferometry (ESPI). It covers topics such as: parameters for design and optimization; measurment of static and dynamic surface displacements; pulsed lasers; and TV holography.

Digital Speckle Pattern Interferometry and Related Techniques

Digital Speckle Pattern Interferometry and Related Techniques
Author: Pramod K. Rastogi
Publisher: John Wiley & Sons
Total Pages: 392
Release: 2001-02-08
Genre: Science
ISBN:

Digital Speckle Interferometry and Related Techniques provides a single source of information in this rapidly progressing field. Containing contributions from leading experts, it provides the key background information, including the fundamental concepts, techniques, and applications, and presents the major technological progress that has contributed to revitalization in the field over the past fifteen years, including digital speckle photography and digital holographic interferometry.

Holographic and Speckle Interferometry

Holographic and Speckle Interferometry
Author: Robert Jones
Publisher: Cambridge University Press
Total Pages: 372
Release: 1989-01-26
Genre: Science
ISBN: 9780521348782

Holographic and speckle interferometry are optical techniques which use lasers to make non-contracting field view measurements at a sensitivity of the wavelength of light on optically rough (i.e. non-mirrored) surfaces. They may be used to measure static or dynamic displacements, the shape of objects, and refractive index variations of transparent media. As such, these techniques have been applied to the solution of a wide range of problems in strain and vibrational analysis, non-destructive testing (NDT), component inspection and design analysis and fluid flow visualisation. This book provides a self-contained, unified, theoretical analysis of the basic principles and associated opto-electronic techniques (for example Electronic Speckle Pattern Interferometry). In addition, a detailed discussion of experimental design and practical application to the solution of physical problems is presented. In this new edition, the authors have taken the opportunity to include a much more coherent description of more than twenty individual case studies that are representative of the main uses to which the techniques are put. The Bibliography has also been brought up to date.

Selected Papers on Optical Pattern Recognition

Selected Papers on Optical Pattern Recognition
Author: Francis T. S. Yu
Publisher: SPIE-International Society for Optical Engineering
Total Pages: 668
Release: 1999
Genre: Computers
ISBN:

SPIE Milestones are collections of seminal papers from the world literature covering important discoveries and developments in optics and photonics.

Optical Methods of Measurement

Optical Methods of Measurement
Author: Rajpal Sirohi
Publisher: CRC Press
Total Pages: 316
Release: 2018-09-03
Genre: Technology & Engineering
ISBN: 1420017764

Optical Methods of Measurement: Wholefield Techniques, Second Edition provides a comprehensive collection of wholefield optical measurement techniques for engineering applications. Along with the reorganization of contents, this edition includes a new chapter on optical interference, new material on nondiffracting and singular beams and their applications, and updated bibliography and additional reading sections. The book explores the propagation of laser beams, metrological applications of phase-singular beams, various detectors such as CCD and CMOS devices, and recording materials. It also covers interference, diffraction, and digital fringe pattern measurement techniques, with special emphasis on phase measurement interferometry and algorithms. The remainder of the book focuses on theory, experimental arrangements, and applications of wholefield techniques. The author discusses digital hologram interferometry, digital speckle photography, digital speckle pattern interferometry, Talbot interferometry, and holophotoelasticity. This updated book compiles the major wholefield methods of measurement in one volume. It provides a solid understanding of the techniques by describing the physics behind them. In addition, the examples given illustrate how the techniques solve measurement problems.